Index IntroductionTime required for Xrf analysisImportance of Xrf:Application of Xrf:Limitations of Xrf:Ofa Binder FunctionsClassifications of Binding SystemsLiterature ReviewIntroductionXRF is an abbreviation used for X-ray fluorescence. It is the phenomenon in which X-rays with a threshold energy greater than the energy of the electrons produced by the X-ray tube analyzer when hitting the electrons of the inner shell of atoms, displacing the electrons thus creating a void space. Electrons from the higher energy level jump down to fill that space, emitting radiation that is characteristic of the specific element. The emitted energy is recorded by the detector in the XRF spectrophotometer. Say no to plagiarism. Get a tailor-made essay on "Why Violent Video Games Shouldn't Be Banned"? Get an original assayXRF is a rapid, non-destructive and accurate analytical method for determining the chemical composition of all types of materials. Both quantitative and qualitative determination of elements can be performed using XRF. The method has high precision and reproducibility. The measurement time is between seconds and 30 minutes and depends on the number of elements to be analyzed. XRF is a widely used method for measuring the elemental composition of rock, soil and mineral samples. Standard reference materials are constantly needed in XRF analysis to ensure the reliability of analytical results. They play an important role during the development of new analytical techniques, methodologies and new sample preparation procedures. It also has a significant role in the evaluation of short- and long-term stability of instrumentation, in the detection of random and/or systematic errors during routine analyses, for cross-calibration of different analytical techniques and methodologies, and in laboratory intercalibrations. (Ingamells and Pitard, 1986). All spectrophotometers are basically composed of a sample holder, an atom excitation source and a detection system. The primary function of a source in spectrophotometers is to irradiate a sample, exciting the atoms present in the sample. The emitted radiation is measured by the detector. In the XRF instrument the excitation source is an X-ray tube. The spectrometer system is generally of two groups: energy dispersive system (EDXRF) and wavelength dispersive system (WDXRF). The detection system is different in these two. In the EDXRF spectrometer the detector measures various energy characteristics emitted directly from the sample. The detector can separate the radiation from the sample into the radiation emitted by the respective elements present in the sample, which is what is called dispersion. The detection range of elements is from sodium to uranium and the detection limit is good for heavy elements. In the WDXRF spectrometer there is an analyzer crystal that disperses different energies. The radiation hits the crystal and diffracts in different directions. The detection range of elements ranges from beryllium to uranium. The detection limit is good for both lighter and heavier elements. The primary X-ray beam from the X-ray tube falls on the sample, interacting with the atoms in the sample. The electrons are disposed of from the internal shells of the atom. The movement of electrons from the inner shell is due to the energy difference between the primary X-ray beam emitted by the analyzer and the binding energy of the electrons in their shell which keeps them in their correct orbits. In this whole process the energy of the X-rays is higher than the binding energy of the electron.The eliminated electron leaves an empty space that makes the atom unstable. Electrons from high-energy orbits jump down to fill that vacancy with the release of radiation called secondary x-ray beam/fluorescence. The amount of energy lost is equivalent to the difference between the shell of two electrons, i.e. ΔE= E2-E1. Where E2= energy of the upper shellE1= energy of the inner shellshells.ΔE= difference between two energy levels. The amount of energy lost is unique to each element in the sample and can be used to identify elements. The individual energies are calculated by the detectors. The quantity of each element can be measured by the proportions of these individual energies. Time required for Xrf analysis The time taken by the sample for measurement depends on the nature of the sample and the levels of interest, i.e. the type of elements to be analyzed and in what form the sample is to be fed into XRF. High percentage elements took a few seconds while parts per million levels took a few minutes. The excitation process and the emission of secondary X-rays during the deexcitation process of the atoms present in the sample occur in a small fraction of seconds. Modern portable XRF can be designed in seconds for such measurement. Generally the measurement time is between seconds and 30 minutes and depends on the number of elements to be analyzed. After measurement, analyzing the sample takes a few seconds. For major element detection, the sample is loaded as a glass bead/fusion bead, which takes approximately eight seconds. Importance of Xrf:XRF has become a popular method in elemental analysis in geological investigations. This is due to the following reasons. Sample preparation for XRF analysis is quite simple and economical. The measurement of elements in the sample is rapid. It does not require highly experienced analysts. Even an experienced assistant can run and operate the machine. The XRF method is not as expensive as the ICP method. Unlike the ICP method, it is not a destructive method of the sample. This method is extremely accurate and precise. The detection limit is very good. Application of Xrf:XRF The method for measuring the sample has broader applications. It can accurately measure all metals, concrete, oils, polymers and plastics. Applications also include environmental analysis of water, waste materials, rocks and soil analysis. Limitations of Xrf: XRF cannot measure organic samples. XRF is not useful for measuring isotopes of elements. Types of sample preparation: Different methods of powdered samples, such as rocks, minerals, and ceramics, have been used for analysis using x-ray fluorescence (xrf). These methods include the pellet (briquette) method (Tertian and Claisse, 1982; Feret and Jenkins, 1998; Matsumoto and Fuwa, 1979; Guevara and Verma, 1987) and the glass bead (casting) method (Tertian and Claisse, 1982; Feret and Jenkins, 1998; norrish and Thompson, 1990; hua and yap, 1994) for normal sample quantities. for small quantities of sample the filter cake method is used (stankiewivez et al., 1996) which consists in filtering the dust or precipitate suspension. The most used method among these is the pressed powder method. Since the pressed powder method is simple, it takes less time to prepare and is obviously non-destructive. Both solids and liquids can be measured analytically with the help of XRF. Mostly the samples are in circular disks with a radius between 5 and 50 mm. the sample is placed in a sample cup which is placed in the spectrometer. For the analysis of powders and liquids, special films are usedsupport.Ofa Binder FunctionsThe functions of a binder are:It holds the particles together after the pellet has been dried and before it finally hardens.During the drying process, the binder holds the sample particles together while the water is removed; Continue binding the particles together until the pellet is heated sufficiently. Classifications of Bonding SystemsBinds can be defined as anything that holds particles together and forms a mass. Some binders are specific to a particular type of material. Therefore, not all of them can be used in all possible applications. Therefore, binders are classified into the following five groups (Holley 1982): The binder causes the sample particles to stick together by forming a sticky layer on top of the particles. The binding forces can be adhesive or cohesive. The binding is reversible in case of inactive binding films. The binder forms a film on the surface of the sample particles which then hardens after going through a chemical reaction. It is a type of irreversible bond. A continuous matrix is ​​formed from such binders in which the sample particles are embedded. These binders require high pressure which forces the particles to compact. Binders when heated emulsify to form a fluid. As it cools, it becomes hard and dry. Includes tar, pitch, or wax-type materials. The bond when heated is reversible. A continuous matrix is ​​formed by such ligands. As its name indicates, it undergoes a chemical reaction that causes it to harden. The bond is irreversible. The binder undergoes a chemical reaction with the sample material and forms a strong bond with it. Such binders are specific only to particular materials and the bond is irreversible. The widely used binder is an inactive film because it holds particles without chemical reaction and compaction pressure and is effective at low dosage. The samples are weighed together with the binder at a 10:1 ratio. Subsequently the specimen is pressed with a pressure of 20 ton feet for one minute. The MiniPress model PW4020/00 hydraulic press is used for pressing sample powders. An AXIOS Advance PW2404 wavelength-dispersive PA-Analytic spectrometer (Philips, the Netherlands) with SuperQ software was operated with an Rh tube at a maximum of 60 kV and 125 mA. Eivindson literature review. T and 0yvind Mikkelsen examined the problems using pressed powder for XRF analysis for ferrosilicon alloys. The problem arose due to the heterogeneity of the solidified ferrosilicone. Several distinct crystallographic phases with different X-ray absorption and milling properties are formed from the molten metal. The result is large particle effects. This in turn affects the accuracy and precision of XRF measurement and analysis. Despite this, the stability of the powder pellets was also compromised. To have a more stable pellet and less influenced by radiation, the choice of a binder is necessary. To minimize problems arising from the use of pressed powder, it is important to strictly control sample preparation routines.V. Ahadnejad et al. sought to establish a simple and fast analytical standard for X-ray fluorescence spectrometry. 15 typical granitic rock samples from the Malayer granitoid complex of western Iran were selected to obtain a representative standard of mineral samples. Their biotites were separated and then analyzed using ICP and used as new standards. The separated minerals were evaluated as candidates for reference materials for major element composition. The minerals were analyzed using the ICP method..